Inhalt

[ TPMWTVOADMI ] VL Advanced Microscopy

Versionsauswahl
(*) Leider ist diese Information in Deutsch nicht verfügbar.
Workload Ausbildungslevel Studienfachbereich VerantwortlicheR Semesterstunden Anbietende Uni
3 ECTS M2 - Master 2. Jahr Physik Kurt Hingerl 2 SSt Johannes Kepler Universität Linz
Detailinformationen
Quellcurriculum Masterstudium Technische Physik 2020W
Ziele (*)The major objective for this course is to deepen the understanding for the interactions between electrons and the materials. Especially electron microscopy and electron spectroscopy techniques are highlighted and used for material analysis.

In addition, a lab session on the JEOL SEM will be organized, where each student can work with hands on with given samples or his/her own samples.

Necessary (examined) Prerequisites:
Grundlagen III (Optics) and Grundlagen IV (Quantum Mechanics)
Theory II (Quantum Mechanics)
Solid State Physics

Lehrinhalte (*)a) a repetition of Fourier optics and the diffraction limit
b) Interaction of electrons with Matter (secondary, backscattered, Auger e-)
c) Electron optics for a scanning electron microscope and a transmission electron microscope
d) Electron Sources, detectors and spectrometers
e) Types of and applications for scanning electron microscopes
f) Types of and applications for transmission electron microscopes. g) Analytical techniques for Chemistry: (Auger, X-ray Analysis, XPS, EBIC, CL)
h) Crystal structure analysis with electrons (EBSD)
Beurteilungskriterien (*)Oral exam testing the understanding of the concepts of electron microscopy and electron spectroscopy, as well as their application in SEM and TEM.
Lehrmethoden (*)Teaching is done by deriving important formulas and concepts on the blackboard as well as powerpoint presentation.

In addition, a lab session on the JEOL SEM will be organized, where each student can work with hands on with given samples or his/her own samples.

Abhaltungssprache Englisch
Literatur (*)David B. Williams, C. Barry Carter, Transmission Electron Microscopy: A Textbook for Materials Science, Springer, Berlin; 2009
Ludwig Reimer (Rudolf Reichelt): Scanning Electron Microscopy: Physics of Image Formation and Microanalysis, Springer, Berlin 2010, bzw. 1998
L. Reimer (Helmut Kohl) Transmission Electron Microscopy: Physics of Image Formation, (Springer Series in Optical Sciences) Springer, Berlin (2008)
Adam J. Schwartz, Mukul Kumar, und Brent L. Adams , Electron Backscatter Diffraction in Materials Science, Springer, Berlin (2009)
Marc De Graef, Introduction to Conventional Transmission Electron Microscopy, Cambridge (2003)
Lehrinhalte wechselnd? Nein
Sonstige Informationen (*)Course is held biannualy info: kurt.hingerl@jku.at
Präsenzlehrveranstaltung
Teilungsziffer -
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