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| Detailinformationen |
| Quellcurriculum |
Masterstudium Physics 2025W |
| Lernergebnisse |
Kompetenzen |
| (*)Upon successful completion of the course, students are able to explain the fundamental principles of electron microscopy (EM) and spectroscopy, and distinguish between the main EM techniques. They can describe the primary interaction mechanisms between electrons and matter. Additionally, students can explain different EM contrast mechanisms and critically analyze EM images, obtained from their own projects or research articles.
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| Fertigkeiten |
Kenntnisse |
(*)Upon completing the course, students will possess the following skills. They are able to
- explain the main components and working principle of the different types of electron microscopes (k2);
- differentiate basic electron-mater interactions (k3);
- compare the working principle of different imaging and diffraction methods (k4);
- evaluate EM images based on the method used and the expected contrast mechanism (k5);
- explain and assess the advantages and disadvantages of the spectroscopy methods EDXS and EELS (k2/k3);
- select a suitable EM technique for an experimental task (k4).
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(*)During the course, students will acquire knowledge in the area of electron microscopy and spectroscopy:
- main EM components: electron guns, electron optics, detectors, spectrometer;
- types of EM: scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM);
- electron-matter interactions;
- backscattered electron (BSE) and secondary electron (SE) signals in SEM;
- electron diffraction TEM: Laue condition, reciprocal lattice, structure factor;
- Howie-Whelan equations;
- TEM amplitude contrast: thickness fringes and bending contours;
- TEM phase contrast and resolution limits;
- energy-dispersive X-ray spectroscopy (EDXS) and electron energy loss spectroscopy (EELS).
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| Beurteilungskriterien |
(*)Evaluation criteria will be announced at the beginning of the semester.
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| Lehrmethoden |
(*)The course primarily consists of lectures on fundamental concepts and the different electron microscopy techniques, supplemented by practical examples from JKU research projects. In one lecture, current electron microscopes are presented in a detailed laboratory tour.
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| Abhaltungssprache |
Englisch |
| Literatur |
(*)David B. Williams, C. Barry Carter, Transmission Electron Microscopy: A Textbook for Materials Science, Springer, Berlin; 2009
Ludwig Reimer (Rudolf Reichelt): Scanning Electron Microscopy: Physics of Image Formation and Microanalysis, Springer, Berlin 2010, bzw. 1998
L. Reimer (Helmut Kohl) Transmission Electron Microscopy: Physics of Image Formation, (Springer Series in Optical Sciences) Springer, Berlin (2008)
Adam J. Schwartz, Mukul Kumar, und Brent L. Adams , Electron Backscatter Diffraction in Materials Science, Springer, Berlin (2009)
Marc De Graef, Introduction to Conventional Transmission Electron Microscopy, Cambridge (2003)
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| Lehrinhalte wechselnd? |
Nein |
| Sonstige Informationen |
(*)Course is held biannualy
info: kurt.hingerl@jku.at
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| Frühere Varianten |
Decken ebenfalls die Anforderungen des Curriculums ab (von - bis)
TPMWTVOADMI: VO Advanced Microscopy (2010S-2023S)
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