(*)To obtain practical experience in advanced electron microscopy.
Subject
(*)Preparation of ultrathin layers, immunisation markings on cut edges, identifying crystalline structures by electron diffraction, identifying particle size in suspension by SEM, processing measurement results using the ACC program.
Criteria for evaluation
(*)Hands-on assignments
Methods
(*)Lab experiments, demonstrations
Language
English
Changing subject?
No
Further information
(*)There will be a written test before each lab session to ensure students have prepared themselves well at home in advance.
