| Individual lectures will focus on:
1. Physical principles of electron microscopy, physical properties of accelerated electrons, resolution, magnification
2. Transmission electron microscope, electromagnetic lenses and their defects, instrument construction
3. Sample preparation for TEM by physical methods, kryomethods, microwaves
4. Sample preparation for TEM by chemical methods, fixation, dehydration, watering
5. Preparation of ultralight cuts, ultramicrotom, knives, contrasting, underlayer foil
6. Scanning electron microscopy, instrument construction
7. Sample preparation for SEM, drying, metal plating
8. Electronmicroscopic cytology
9. Artifacts in TEM and SEM caused by preparation, instrumentation, topography process
10. Digital and photographical recording of microscopic picture
Preparing half-thin cuts, modification of nets and covering by formed membranes, the visualization of plant virus with the method of reversed contrasting, preparing samples for SEM, working with TEM and SEM, viewing prepared samples.
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