Studienhandbuch | VL High Resolution Microscopy I - Optical and Electron Microscopy Techniques

Inhalt

[ 479CACTHM1V13 ] VL High Resolution Microscopy I - Optical and Electron Microscopy Techniques

Workload	Education level	Study areas	Responsible person	Hours per week	Coordinating university
1,5 ECTS	M1 - Master's programme 1. year	Chemistry	Sabine Hild	1 hpw	Johannes Kepler University Linz

Detailed information

Original study plan

Master's programme Polymer Engineering and Science (PES) 2026W

Learning Outcomes

Competences
The course is an introduction into modern high resolution microscopy techniques. It provides students with knowledge and information on diffraction-based microscopy techniques, with particular emphasis on electron microscopy (EM techniques) and the corresponding fields. Electron microscopes are indispensable analytical instruments in the field of materials and life science. The aim of the course is to give a broad overview of the electron microscopy and to position the technique in the general framework of optical methods. The specific properties of electron instruments, which are due to the different types of interactions of electrons with matter, will be introduced step by step. The aim is to familiarise students with the use of electron microscopes in their research. Students are able to describe the components of an electronmicroscope and explain the basic working principle. Students are capable of interpreting electron microscopic images found in the scientific literature. They identify different techniques they can apply in relation to the samples to be analysed. Students are able to explain the characteristics of the different signals used for imaging in scanning electron microscopy (SEM) and the influence the different operating parameters can have on these images.

Skills	Knowledge
After completion of the course the student should have the knowledge and ability to describe the components of an electron microscope (EM) and the basic working principles.(k2) to explain the characteristics of the different signals used for imaging in scanning electron microscopy (k3) to describe that different operating parameters can have on the images to describe suitable sample preparation techniques for SEM experiments on various materials (k3, k6) to plan SEM experiments on different materials (k3, k6) to analyze SEM images with the ability to interpret the results in terms of operating parameter(k3, k4) critically interpret SEM data both own and in literature with relation to different material classes (k5)After completion of the course the student should have the knowledge and ability to describe the components of an electron microscope (EM) and the basic working principles.(k2) to explain the characteristics of the different signals used for imaging in scanning electron microscopy (k3) to describe that different operating parameters can have on the images to describe suitable sample preparation techniques for SEM experiments on various materials (k3, k6) to plan SEM experiments on different materials (k3, k6) to analyze SEM images with the ability to interpret the results in terms of operating parameter(k3, k4) critically interpret SEM data both own and in literature with relation to different material classes (k5)"	This course will provide knowledge on the Electron-matter interaction and contrast mechanisms the operating principles and components of electron microscopy (EM) which information and results can be obtained with SEM in relation to different material classes how SEM can be used in applied research and/or industrial settings how to apply SEM experiments relevant to own research

Criteria for evaluation

Methods

This course is designed to provide the background and basics of electron microscope (EM) with a focus on the application of scanning electron microscopy for imaging and materials characterization. The course begins with a comparison of the properties of visible light and electrons. It provides insights into geometrical optics and explains the relationships between diffraction limit, aberration, resolution and depth of field, as well as Abbe's theory.

Language

English

Changing subject?

Corresponding lecture

in collaboration with 479CACTHM2V13: High Resolution Microscopy II - Scanning Probe Techniques (1,5 ECTS) equivalent to
700POWINMSV11: VL New microscopic and spectroscopic methods for polymer characterization (2,6 ECTS) or WKMKAVOCIIP: VO Neue Methoden der Mikroskopie (3 ECTS)

On-site course
Maximum number of participants	-
Assignment procedure	Direct assignment