Inhalt
[ 479CACTHM2V13 ] VL (*)High Resolution Microscopy II - Scanning Probe Techniques
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| Workload |
Ausbildungslevel |
Studienfachbereich |
VerantwortlicheR |
Semesterstunden |
Anbietende Uni |
| 1,5 ECTS |
M1 - Master 1. Jahr |
Chemie |
Sabine Hild |
1 SSt |
Johannes Kepler Universität Linz |
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| Detailinformationen |
| Quellcurriculum |
Masterstudium Polymer Engineering and Science 2026W |
| Lernergebnisse |
Kompetenzen |
(*)The course gives an introduction into modern high resolution microscopy techniques. It provides students with knowledge and information about non-diffraction-based microscopy techniques. They learn about the functional principles of scanning probe microscopy, with a particular focus on atomic force microscopy (AFM). Scanning probe microscopes are essential analytical tools in the field of materials and life sciences. The aim of the course is to give a broad overview of scanning probe microscopy and, in particular, to place atomic force microscopy (AFM) in the general context of diffraction optical methods. The specific properties of atomic force microscopes, which are due to the different types of force interactions at the molecular level, will be introduced step by step. The aim is to familiarise students with the use of scanning probe microscopes in their research.
- Students are able to describe the components of the AFM and explain the basic working principle, such as contact and intermittent contact modes and know the common imaging artefacts.
- Students are capable of interpreting atomic force microscope images found in the scientific literature.
- Students are familiar with different AFM techniques and know how to apply these on organic and inorganic samples to be analysed.
- Students are familiar with the safety-related principles in the laboratory.
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| Fertigkeiten |
Kenntnisse |
(*)After completion of the course the student should have the knowledge and ability
- to describe the components of the atomic force microscopy (AFM) and the basic working principles.(k2)
- to explain and differentiate between the AFM operation modes (k3)
- to describe various imaging artefacts and recognise them in AFM images
- to describe suitable sample preparation techniques for AFM experiments various materials (k3, k6)
- to plan AFM experiments on different materials (k3, k6)
- to analyze AFM images and nanomechanical measurements with the ability to interpret the results in terms of surface interactions (k3, k4)
- to critically interpret AFM data both own and in literature with relation to different material classes (k5)"
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(*)This course is designed to provide the background and basic concepts of scanning probe microscopy in particular of atomic force microscopy (AFM) in the context of polymer-based materials. It will provide knowledge of
- the operating principles and components *what information and results can be obtained with AFM in relation to polymer-based materials
- how AFM can be used in applied research and/or industrial settings
- knowledge to recognize common artefacts, analyze AFM measurements, interpret the results in terms of surface interactions
- preparation techniques of polymer surfaces for AFM measurements
- how to plan AFM experiments relevant to own research.
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| Beurteilungskriterien |
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| Abhaltungssprache |
Englisch |
| Lehrinhalte wechselnd? |
Nein |
| Äquivalenzen |
(*)in collaboration with 479CACTHM1V13: VL High Resolution Microscopy I - Optical and Electron Microscopy Techniques (1,5 ECTS) equivalent to
700POWINMSV11: VL New microscopic and spectroscopic methods for polymer characterization (2,6 ECTS) or WKMKAVOCIIP: VO Neue Methoden der Mikroskopie (3 ECTS)
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| Präsenzlehrveranstaltung |
| Teilungsziffer |
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| Zuteilungsverfahren |
Direktzuteilung |
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