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| Detailed information |
| Original study plan |
Master's programme Physics 2025W |
| Learning Outcomes |
Competences |
| Upon successful completion of the course, students are able to explain fundamental concepts related to surfaces, interfaces and thin films. They can describe the principles and methods used for surface and thin film analysis. They are able to interpret data from experiments and simulations in this field. Students can identify and solve complex problems in thin film fabrication and characterization, applying both theoretical and experimental knowledge. These competencies enable students to contribute to research and development in fields that utilize surface and thin film technologies.
This lecture is methodologically complemented by the lab course Analytics of Surfaces and Thin Films.
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| Skills |
Knowledge |
Upon completing the course, students will possess the following skills. They are able to
- describe modern characterization instruments, including sample preparation and handling, ensuring high-quality data collection (k1/k2);
- design experiments to investigate specific surface properties or thin film characteristics, including the formulation of hypotheses and methodologies (k3);
- interpret complex data obtained from various analytical techniques and connect them to material properties and behaviors (k3/k4);
- investigate and model surface phenomena, including the use of software tools for simulation and data visualization (k5);
- describe and critically discuss how surface and thin film analytics intersect with various fields such as nanotechnology, electronics and materials engineering (k5).
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During the course, students will acquire knowledge in the following areas and concepts of surface analytics and thin films:
- fundamental theories underlying surface and thin film phenomena, such as surface electronic states, crystallography and quantum effects at reduced dimensions;
- analytical methods used for surface and thin film analysis, including but not limited to X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), ion scattering spectroscopy (ISS); secondary ion mass spectrometry (SIMS) and optical spectroscopy (OS);
- synthesis and properties of materials used in thin films, including metals, semiconductors and insulators.
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| Criteria for evaluation |
seminar presentation
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| Methods |
lectures, discussions, laboratory visits, preparation of seminar presentation
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| Language |
English |
| Study material |
John C. Vickerman, Surface Analysis – The Principle Techniques, HOHN WILLEY & SONS 1997.
Kenjiro Oura et al, Surface Science – An Introduction, Springer-Verlag 2002.
Transparencies available (KUSSS).
Additional study material for case study.
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| Changing subject? |
No |
| Further information |
Basic course for Master and PhD students interested in surface science, nanoscience and materials science.
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| Corresponding lecture |
TPMPNVONAC2: VL Nanocharacterisation II (3 ECTS)
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| Earlier variants |
They also cover the requirements of the curriculum (from - to)
TPMWTVOAODS: VO Analytics of surfaces and thin layers (2009W-2023S)
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