Upon successful completion of the course, students are able to explain fundamental concepts related to surfaces, interfaces and thin films. They can describe the principles and methods used for surface and thin film analysis. They are able to interpret data from experiments and simulations in this field. Students can identify and solve complex problems in thin film fabrication and characterization, applying both theoretical and experimental knowledge. These competencies enable students to contribute to research and development in fields that utilize surface and thin film technologies.
This lab course is methodologically complemented by the lecture Analytics of Surfaces and Thin Films.
Skills
Knowledge
Upon completing the course, students will possess the following skills. They are able to
design and develop a protocol for a specific surface/interface/thin film sample system (k2/k3);
prepare the surface/interface/thin film sample system (k3);
characterize the surface/interface/thin film sample system and critically evaluate the results (k3-k5);
analyze and summarize the obtained results in a laboratory report (k4/k5);
critically discuss the results and present the finding in the context of the scientific literature (k5).
During the course, students will acquire practical knowledge in the following areas and concepts of surface analytics and thin films:
state-of-the-art techniques for characterization of surfaces/interfaces/thin films and other low-dimensional systems;
applications of surface and thin film analysis for in situ, ex situ and on-line characterization;
impact of various analytical techniques on target systems.
Criteria for evaluation
A combined grade will be determined, based on the preparation and execution of the experiments, the written protocol and the debriefing meeting with the supervisor, during which the results will be discussed.
Methods
The practical course will take place in a state-of-the-art laboratory for surface analysis and nanocharacterization.
Language
English
Study material
John C. Vickerman, Surface Analysis – The Principle Techniques, HOHN WILLEY & SONS 1997.
Kenjiro Oura et al, Surface Science – An Introduction, Springer-Verlag 2002.
Transparencies available (KUSSS). Updated questions for exercises (KUSSS).
Changing subject?
No
Corresponding lecture
TPMPNPRNAC2: PR Nanocharacterisation II (1.5 ECTS) -or- TPMWTUEAODS UE Analytik von Oberflächen und dünnen Schichten (1,5 ECTS)
