Upon completing the course, students will possess the following skills. They are able to
- describe and explain the fundamental concepts and methods of microscopy (k2/k3);
- explain and discuss basic concepts of material characterization using different probes (k2/k3);
- explain probe-sample interactions and the information that can be obtained with different techniques (k2/k3);
- describe, explain and analyze the instrumentation and spatial resolution of optical, X-ray and electron microscopy (k2/k3/k4);
- describe and explain the optical elements and their properties used in microscopy (k2/k3).
|
During the course, students will acquire knowledge in the following areas and concepts of nanocharacterization:
- optical, X-ray, electron and scanning probe microscopy;
- probes for material characterization and the different kinds of elastic and inelasctic probe sample interactions;
- optical spectroscopy;
- X-ray diffraction;
- fundamental properties and limitations of microscopy, resolution limits, modulation transfer function.
|
